Title :
In situ emission microscopy of scandium/scandium oxide and barium/barium oxide thin films on tungsten
Author :
Vaughn, Joel M. ; Kordesch, Martin E.
Author_Institution :
Dept. of Phys. & Astron., Ohio Univ., Athens, OH
Abstract :
The effect of a thin Sc/Sc Oxide base layer on Ba/Ba Oxide surface diffusion, adsorption and desorption on W is studied using photoelectron emission microcopy (PEEM) and thermionic emission microscopy (ThEEM).
Keywords :
adsorption; barium; barium compounds; desorption; photoelectron microscopy; scandium; scandium compounds; surface diffusion; thermionic emission; Ba; BaO; PEEM image; Sc; ScO; ThEEM images; W; adsorption; desorption; in situ emission microscopy; surface diffusion; temperature 1000 K to 1400 K; temperature 900 K; thermionic emission microscopy; thin films; Barium; Optical films; Photoelectron microscopy; Scanning electron microscopy; Sputtering; Substrates; Temperature; Thermionic emission; Transistors; Tungsten;
Conference_Titel :
Vacuum Electronics Conference, 2008. IVEC 2008. IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-1715-5
DOI :
10.1109/IVELEC.2008.4556423
