• DocumentCode
    2006049
  • Title

    Evaluating the Influence of Current on the Wear Processes of Au/Cr-Au/MWCNT Switching Surfaces

  • Author

    Chianrabutra, C. ; Jiang, L. ; Lewis, A.P. ; McBride, J.W.

  • Author_Institution
    Electro-Mech. Eng., Univ. of Southampton, Southampton, UK
  • fYear
    2013
  • fDate
    22-25 Sept. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Wear processes of the switching contact pair consisting of a gold layer on multiwall carbon nanotubes (Au/MWCNT) and a chromium and gold coated hemispherical ball (Au/Cr) are evaluated over a range of current conditions. The switching experiments were conducted using typical conditions for a MEMS relay application, i.e. 4 V, with static contact force 1 mN with currents level of 20-200mA. The Au coated MWCNT substrate exhibited a transfer process over a large number of switching cycles. On the assumption that the transfer process was a combination of a fine transfer and delamination processes; a previous experimental investigation was considered by dividing the wear processes into four stages of a failure behavior. It is observed that the fine transfer process dominates in the unstable and stable contact resistance stage and then the delamination dominates in the rising stage and a failure process. The increase of contact resistance was used to identify contact failure.
  • Keywords
    ageing; carbon nanotubes; chromium alloys; contact resistance; delamination; gold; gold alloys; microrelays; nanotube devices; wear; Au-CrAu-C; MEMS switching surface; MWCNT substrate; ageing; chromium gold coated hemispherical ball; contact resistance stage; current 20 mA to 200 mA; delamination process; fine transfer mechanism; gold film layer; microelectromechanical systems; multiwall carbon nanotubes; stable stage; switching contact pair; switching experiments; switching surfaces; voltage 4 V; wear processes; Contact resistance; Delamination; Gold; Materials; Predictive models; Surface treatment; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Holm Conference on Electrical Contacts (HOLM) , 2013 IEEE 59th
  • Conference_Location
    Newport, RI
  • ISSN
    1062-6808
  • Print_ISBN
    978-1-4799-1556-9
  • Type

    conf

  • DOI
    10.1109/HOLM.2013.6651411
  • Filename
    6651411