Title :
Particle Size Determination in Electrical Arcs Using X-Ray Scattering
Author :
Carvou, E. ; Le Garrec, Jean Luc ; E Yee Kin Choi ; Mitchell, J.B.A.
Author_Institution :
Inst. de Phys. de Rennes, Univ. de Rennes I, Rennes, France
Abstract :
This article discusses recent synchrotron radiation based measurements of nanoparticle formation between arcing contacts.
Keywords :
X-ray scattering; arcs (electric); electrical contacts; nanoparticles; particle size; synchrotron radiation; X-ray scattering; arcing contacts; electrical arcs; nanoparticle formation; particle size determination; synchrotron radiation based measurements; Atmospheric measurements; Electrodes; Nanoparticles; Particle measurements; Scattering; Silver; Size measurement;
Conference_Titel :
Holm Conference on Electrical Contacts (HOLM) , 2013 IEEE 59th
Conference_Location :
Newport, RI
Print_ISBN :
978-1-4799-1556-9
DOI :
10.1109/HOLM.2013.6651421
