DocumentCode :
2006320
Title :
Research on Current-Carrying Wear Characteristics of Friction Pair in Pantograph Catenary System
Author :
Zhiyong Wang ; Fengyi Guo ; Zhonghua Chen ; Aixia Tang ; Zhiling Ren
Author_Institution :
Liaoning Tech. Univ., Huludao, China
fYear :
2013
fDate :
22-25 Sept. 2013
Firstpage :
1
Lastpage :
5
Abstract :
To solve the serious wear problem of pantograph slide in electrified railway pantograph catenary system, lots of current-carrying wear experiments under different conditions were carried out with a self-developed sliding electrical contact testing machine. The experimental materials are immersed copper carbon slide and copper contact wire respectively. Relationships between wear rate of slide and contact pressure, contact current and sliding speed were analyzed. The F-test method was used to compare the influence degree of three factors on wear rate based on variance analysis table. The optimal nonlinear functions between wear rate and single influencing factor were obtained by curve fitting method. A mathematical model of the wear rate was established by the multi-variable nonlinear regression method. The conclusions have certain reference value to research of the current-carrying wear characteristics of friction pairs in pantograph catenary systems.
Keywords :
curve fitting; electric locomotives; electrical contacts; friction; nonlinear functions; pantographs; regression analysis; wear; F-test method; contact current; contact pressure; copper contact wire; current-carrying wear characteristics; curve fitting method; electrified railway pantograph catenary system; friction pair; immersed copper carbon slide; multivariable nonlinear regression; nonlinear functions; pantograph catenary system; pantograph slide; self-developed sliding electrical contact testing machine; slide wear rate; sliding speed; variance analysis table; Contacts; Copper; Data models; Friction; Mathematical model; Testing; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Holm Conference on Electrical Contacts (HOLM) , 2013 IEEE 59th
Conference_Location :
Newport, RI
ISSN :
1062-6808
Print_ISBN :
978-1-4799-1556-9
Type :
conf
DOI :
10.1109/HOLM.2013.6651423
Filename :
6651423
Link To Document :
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