• DocumentCode
    2006662
  • Title

    An evaluation of CMOS adders in deep submicron processes

  • Author

    Gera, Rahul J. ; Hoe, David H K

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Texas at Tyler, Tyler, TX, USA
  • fYear
    2012
  • fDate
    11-13 March 2012
  • Firstpage
    126
  • Lastpage
    129
  • Abstract
    An evaluation of various adders that are representative of different CMOS logic design styles is carried out for nanoscale CMOS technologies using a Predictive Technology Model from [1]. The adders under consideration are the static CMOS mirror adder, the Complementary Pass-transistor Logic (CPL) adder, the Transmission Gate Adder (TGA), and the Hybrid-CMOS adder (HCMOS). The adders are evaluated in terms of delay, power dissipation, voltage scalability, and area. Because scaling of the voltage supply to less than 1 V results in gate overdrive factors of less than 0.5 V, it is found that adders that maintain the optimum signal paths for both high and low signals (the mirror and TGA adders) had the best performance metrics when scaled to the deep submicron regime. The adders that rely upon PMOS feedback for signal restoration (the CPL and HCMOS designs) experienced significant degradation in performance at low power supply voltages.
  • Keywords
    CMOS logic circuits; adders; logic design; CMOS adders; CMOS logic design; CMOS mirror adder; CPL adder; HCMOS adder; PMOS feedback; TGA; complementary pass-transistor logic adder; deep submicron processes; hybrid CMOS adder; low power supply voltages; optimum signal paths; power dissipation; predictive technology model; signal restoration; transmission gate adder; voltage scalability; Adders; CMOS integrated circuits; CMOS technology; Capacitance; Delay; Logic gates; Power dissipation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Theory (SSST), 2012 44th Southeastern Symposium on
  • Conference_Location
    Jacksonville, FL
  • ISSN
    0094-2898
  • Print_ISBN
    978-1-4577-1492-4
  • Type

    conf

  • DOI
    10.1109/SSST.2012.6195123
  • Filename
    6195123