DocumentCode :
2006832
Title :
Automated Noise and Gain Measurement Set-Up and Application to Noise Modelling
Author :
Byzery, Bernard
Author_Institution :
Laboratoires d´´Electronique Philips, 3 avenue Descartes, 94451 Limeil-Brevannes, France
fYear :
1989
fDate :
4-7 Sept. 1989
Firstpage :
1201
Lastpage :
1204
Abstract :
For a circuit designer, the determination of the small signal equivalent circuit and the noise parameters of the FETs are the most important. The comparison of different devices and the qualification of noise models require a precise determination of the noise parameters. The aim of this paper is to describe a completely automated noise characterization set-up and the application to the extraction of equivalent noise parameters.
Keywords :
Automatic control; Circuit noise; FETs; Frequency; Gain measurement; Impedance measurement; Noise figure; Noise generators; Noise measurement; Tuners;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1989. 19th European
Conference_Location :
London, UK
Type :
conf
DOI :
10.1109/EUMA.1989.334136
Filename :
4132841
Link To Document :
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