Title :
Automated Noise and Gain Measurement Set-Up and Application to Noise Modelling
Author_Institution :
Laboratoires d´´Electronique Philips, 3 avenue Descartes, 94451 Limeil-Brevannes, France
Abstract :
For a circuit designer, the determination of the small signal equivalent circuit and the noise parameters of the FETs are the most important. The comparison of different devices and the qualification of noise models require a precise determination of the noise parameters. The aim of this paper is to describe a completely automated noise characterization set-up and the application to the extraction of equivalent noise parameters.
Keywords :
Automatic control; Circuit noise; FETs; Frequency; Gain measurement; Impedance measurement; Noise figure; Noise generators; Noise measurement; Tuners;
Conference_Titel :
Microwave Conference, 1989. 19th European
Conference_Location :
London, UK
DOI :
10.1109/EUMA.1989.334136