DocumentCode
2007155
Title
KA and Ray tracing approximation on the surface roughness
Author
Yoon, Young-Keun ; Kim, JongHo
Author_Institution
Radio Technol. Res. Dept., Electron. & Telecommun. Res. Inst., Daejeon, South Korea
fYear
2011
fDate
3-8 July 2011
Firstpage
3355
Lastpage
3357
Abstract
This paper is given the results compared Kirchhoff with ray tracing method for scattering characteristics due to the roughness on the periodic surface. Analysis method used first order Kirchhoff approximation and ray tracing based on viewing volume tube. Finally, there is proved that the provided approximation methods are possible to support to extract practical scattering characteristics.
Keywords
approximation theory; electromagnetic wave scattering; ray tracing; surface roughness; first order Kirchhoff approximation; periodic surface; ray tracing approximation; scattering characteristics; surface roughness; viewing volume tube; Approximation methods; Optical surface waves; Ray tracing; Rough surfaces; Scattering; Surface roughness; Surface waves; approximation; millimeter; rough; tracing;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation (APSURSI), 2011 IEEE International Symposium on
Conference_Location
Spokane, WA
ISSN
1522-3965
Print_ISBN
978-1-4244-9562-7
Type
conf
DOI
10.1109/APS.2011.6058705
Filename
6058705
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