DocumentCode :
2007201
Title :
Effects of perturbing B-field orientation on magnetic priming of a Relativistic Magnetron
Author :
Hoff, Brad W. ; Gilgenbach, Ronald M. ; Jordan, Nick M. ; Lau, Yue Y. ; Cruz, Edward ; French, David ; Gomez, Matthew R. ; Zier, Jacob C. ; Spencer, T.A. ; Price, D.
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI
fYear :
2008
fDate :
22-24 April 2008
Firstpage :
270
Lastpage :
271
Abstract :
Experiments have been performed testing magnetic priming at the cathode of a relativistic magnetron to study the effects on high power microwave performance. Magnetic perturbations were imposed utilizing three, high-permeability nickel-iron wires embedded beneath the emission region of a 1.27 cm diameter cathode, spaced 120 degrees apart (for N/2 symmetry in an N (6) cavity magnetron). These three, high-permeability wires perturb both the axial and radial magnetic fields near the emission region of the cathode. Magnetic priming was demonstrated at UM to increase the percentage of p-mode shots by 15% over the baseline case in the relativistic magnetron. Improvements in microwave power, pulse width and start-oscillation time were also observed. Earlier experimental research by Neculaes and recent simulation work suggest that using permanent magnets with radially-directed remanence fields centered under the cathode emission region instead of high permeability wires can yield improved magnetron performance.
Keywords :
magnetrons; NiFe; high power microwave performance; high-permeability nickel-iron wires; magnetic perturbations; magnetic priming; perturbing B-field orientation; relativistic magnetron cathode; size 1.27 cm; Anodes; Cathodes; Laboratories; Magnetic fields; Magnetostatics; Microwave ovens; Permanent magnets; Saturation magnetization; Testing; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference, 2008. IVEC 2008. IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-1715-5
Type :
conf
DOI :
10.1109/IVELEC.2008.4556506
Filename :
4556506
Link To Document :
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