Title :
Statistical lag time in fluctuation model of liquid dielectric breakdown and experimental results
Author :
Klimkin, V.F. ; Kupershtokh, A.L.
Author_Institution :
Dept. of Phys., Novosibirsk Univ., Russia
Abstract :
The electric breakdown of liquid dielectrics in a uniform field for the nanosecond time range is examined. Experiments on electric breakdown of n-hexane were performed. The time values were registered and analyzed by computer. Results of numerical calculations with a fluctuation model and experimental results for nanosecond breakdowns form the anode are in qualitative agreement. The fluctuation model makes it possible to explain the experimental results and to reveal theoretical dependences of basic characteristics for the breakdown lag phenomenon in the case of uniform and quasi-uniform fields
Keywords :
electric breakdown; breakdown lag phenomenon; electric breakdown; fluctuation model; liquid dielectric breakdown; liquid dielectrics; n-hexane; nanosecond breakdowns; nanosecond time range; quasi-uniform fields; statistical time lag; uniform field; Anodes; Breakdown voltage; Dielectric breakdown; Dielectric liquids; Electric breakdown; Electrodes; Fluctuations; Histograms; Probability; Solid modeling;
Conference_Titel :
Conduction and Breakdown in Dielectric Liquids,1993., ICDL '93., IEEE 11th International Conference on
Conference_Location :
Baden-Dattwil
Print_ISBN :
0-7803-0791-7
DOI :
10.1109/ICDL.1993.593974
