An integrated Automatic Test Generation and executing system

This paper presents an integrated Automatic Test Generation (ATG) and Automatic Test Executing/Equipment (ATE) system for complex boards. We developed an ATG technique called Behavior-Based Automatic Test Generation technique (namely BBATG). BBATG uses the device behavior fault model and represents a circuit board as interconnection of devices. A behavior of a device is a set of functions with timing relations on its in/out pins. When used for a digital circuit board test generation, BBATG utilizes device behavior libraries to drive behavior error signals and sensitize paths along one or multiple vectors so that a heavy and complicated iterating process can be avoided for sequential circuit test deductions. We have developed a complete set of test executing software and test supporting hardware for the ATE which can use the BBATG generated test data directly to detect behavior faults and diagnose faults at the device level for complex circuit boards. In addition, we have proposed and implemented useful technique, especially Design For Testability (DFT) [1][2] application technique on the integrated system, so the test generating/executing for complex boards with VLSI can be further simplified and optimized.