Title :
A 3-D single-electron-memory cell structure with 2F/sup 2/ per bit
Author :
Ishii, T. ; Yano, K. ; Sano, T. ; Mine, T. ; Murai, F. ; Kure, T. ; Seki, K.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Kokubunji, Japan
Abstract :
Summary form only given. A 3-dimensional (3-D) single-electron memory cell, which achieves an area of 2F/sup 2/ per bit (where F is the feature size of the fabricated structures), is proposed. In the proposed vertically united cell (VUC), two cells are stacked vertically which only adds a few steps to the whole fabrication process. The results obtained demonstrate that the single-electron memory has a cost advantage over conventional memories in terms of giga-scale memories. Moreover, with the aim of producing single-electron memory LSI, MOS devices are fabricated on the same wafer as the VUCs, and this set-up shows successful operation.
Keywords :
MOS memory circuits; 3D single-electron-memory cell structure; MOS devices; cost advantage; fabrication process; feature size; giga-scale memories; single-electron memory LSI; vertical stacking; vertically united cell; Costs; Fabrication; Laboratories; Large scale integration; MOS devices; Oxidation; Resists; Scalability; Single electron memory; Wet etching;
Conference_Titel :
Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-4100-7
DOI :
10.1109/IEDM.1997.650532