• DocumentCode
    2007536
  • Title

    A 3-D single-electron-memory cell structure with 2F/sup 2/ per bit

  • Author

    Ishii, T. ; Yano, K. ; Sano, T. ; Mine, T. ; Murai, F. ; Kure, T. ; Seki, K.

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Kokubunji, Japan
  • fYear
    1997
  • fDate
    10-10 Dec. 1997
  • Firstpage
    924
  • Lastpage
    926
  • Abstract
    Summary form only given. A 3-dimensional (3-D) single-electron memory cell, which achieves an area of 2F/sup 2/ per bit (where F is the feature size of the fabricated structures), is proposed. In the proposed vertically united cell (VUC), two cells are stacked vertically which only adds a few steps to the whole fabrication process. The results obtained demonstrate that the single-electron memory has a cost advantage over conventional memories in terms of giga-scale memories. Moreover, with the aim of producing single-electron memory LSI, MOS devices are fabricated on the same wafer as the VUCs, and this set-up shows successful operation.
  • Keywords
    MOS memory circuits; 3D single-electron-memory cell structure; MOS devices; cost advantage; fabrication process; feature size; giga-scale memories; single-electron memory LSI; vertical stacking; vertically united cell; Costs; Fabrication; Laboratories; Large scale integration; MOS devices; Oxidation; Resists; Scalability; Single electron memory; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-4100-7
  • Type

    conf

  • DOI
    10.1109/IEDM.1997.650532
  • Filename
    650532