Title : 
Demonstration of low voltage and functionally complete logic operations using body-biased complementary and ultra-thin ALN piezoelectric mechanical switches
         
        
            Author : 
Sinha, Nipun ; Jones, Timothy ; Guo, Zhijun ; Piazza, Gianluca
         
        
            Author_Institution : 
Univ. of Pennsylvania, Philadelphia, PA, USA
         
        
        
        
        
        
            Abstract : 
This paper reports, for the first time, on the demonstration of low voltage and functionally complete logic elements (NAND and NOR) implemented by using body-biased complementary and ultra-thin (250 nm thick) Aluminum Nitride (AlN) based piezoelectric mechanical switches. This work presents, firstly, the importance of scaling AlN films for the demonstration of ultra-thin AlN switches and, secondly, the implementation of a new actuation scheme based on body biasing to lower the switch threshold voltage. Four of these ultra-thin switches were connected together to synthesize functionally complete MEMS logic gates (NAND and NOR) with a ± 2V swing and a body-bias voltage < 8 V.
         
        
            Keywords : 
aluminium compounds; logic gates; microswitches; piezoelectric actuators; semiconductor thin films; AlN; MEMS logic gate; NAND logic gate; NOR logic gate; body-biased complementary; functionally complete logic element; logic operation; low voltage; scaling AlN films; switch threshold voltage; ultra-thin AlN piezoelectric mechanical switch; Air gaps; Energy consumption; Logic; Low voltage; MOSFETs; Microswitches; Nanoelectromechanical systems; Piezoelectric films; Switches; Threshold voltage;
         
        
        
        
            Conference_Titel : 
Micro Electro Mechanical Systems (MEMS), 2010 IEEE 23rd International Conference on
         
        
            Conference_Location : 
Wanchai, Hong Kong
         
        
        
            Print_ISBN : 
978-1-4244-5761-8
         
        
            Electronic_ISBN : 
1084-6999
         
        
        
            DOI : 
10.1109/MEMSYS.2010.5442297