• DocumentCode
    2007653
  • Title

    Field enhancement on knife-edge cathodes

  • Author

    Miller, Ryan ; Lau, Yue Yin ; Booske, John

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Wisconsin, Madison, WI
  • fYear
    2008
  • fDate
    22-24 April 2008
  • Firstpage
    353
  • Lastpage
    353
  • Abstract
    We extend the analysis of single rectangular-ridge field enhancement to the case of a double ridge.
  • Keywords
    cathodes; electron field emission; cold cathodes; double ridge; field emission; knife-edge cathodes; single rectangular-ridge field enhancement; Cathodes; Copper; Electron emission; Laboratories; Lithography; Nuclear and plasma sciences; Power engineering and energy; Robustness; Surface treatment; Voltage; cold cathodes; field emission; field enhancement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2008. IVEC 2008. IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-1715-5
  • Type

    conf

  • DOI
    10.1109/IVELEC.2008.4556528
  • Filename
    4556528
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2007653