DocumentCode
2007754
Title
Diagnostic alarm sequence maturation in timed failure propagation graphs
Author
Strasser, Shane ; Sheppard, John
Author_Institution
Dept. of Comput. Sci., Montana State Univ., Bozeman, MT, USA
fYear
2011
fDate
12-15 Sept. 2011
Firstpage
158
Lastpage
165
Abstract
Diagnostic model development presents a significant engineering challenge to ensure subsequent diagnostic processes using such models will yield accurate results. One approach to developing system-level diagnostic models that has been receiving attention is the Timed Failure Propagation Graph (TFPG), developed at Vanderbilt University. Unfortunately, developing TFPG models is also difficult and error-prone. In this paper, we extend previous work in using historical maintenance and diagnostic information to identify potential errors in the TFPG-based diagnostic models and recommend ways of maturing these models. This is done by extending the maturation process to incorporate historical alarm sequences and to model these sequences using a probabilistic transition matrix (similar to a Markov chain). The resulting sequence model is compared to the causal relationships identified in the original TFPG to discover discrepancies between the two. Potential sequence modeling errors with recommendations are given back to an engineer or analyst. We report on the maturation process and algorithms and also provide preliminary experimental results.
Keywords
alarm systems; computerised instrumentation; failure analysis; fault diagnosis; graph theory; maintenance engineering; probability; sequences; TFPG based diagnostic model; Vanderbilt University; diagnostic alarm sequence maturation; diagnostic information; historical alarm sequences; probabilistic transition matrix; reasoner historical maintenance information; sequence modeling errors; system level diagnostic model; timed failure propagation graph; Algorithm design and analysis; Atmospheric modeling; History; Maintenance engineering; Monitoring; Ontologies; Probability;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2011 IEEE
Conference_Location
Baltimore, MD
ISSN
1088-7725
Print_ISBN
978-1-4244-9362-3
Type
conf
DOI
10.1109/AUTEST.2011.6058741
Filename
6058741
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