• DocumentCode
    2008013
  • Title

    Optical measurement of carrier properties for InSb

  • Author

    Ogawa, Isamu ; Tsushima, Akira ; Yamaguchi, Sataro ; Hasegawa, Yasuhiro

  • Author_Institution
    Fukui Univ., Japan
  • fYear
    1999
  • fDate
    Aug. 29 1999-Sept. 2 1999
  • Firstpage
    414
  • Lastpage
    416
  • Abstract
    Carrier properties of n-type InSb doped by tellurium at the liquid nitrogen temperature have been measured using the transmission of millimeter wave (119.3 GHz) along a magnetic field up to 4 T in the n-type InSb. Since the wavelength of the millimeter wave in the n-type InSb is generally shorter than that in vacuum (1.26 mm), samples with thicknesses less than 1 mm have been used for the measurement. In the n-type InSb, the millimeter wave injected with the linear polarization has been converted into the helicon wave with the right-hand circular polarization. The helicon wave interacts with an electron and shows the electron cyclotron resonance and its propagation speed depends on the electron density. By studying the dispersion relation from the transmission of the millimeter wave through the n-type InSb, the electron density and effective mass has been estimated.
  • Keywords
    III-V semiconductors; cyclotron resonance; effective mass; electron density; high field effects; indium compounds; tellurium; thermoelectric power; 119.3 GHz; InSb; carrier properties; effective mass; electron cyclotron resonance; electron density; helicon wave; linear polarization; millimeter wave transmission; right-hand circular polarization; Electrons; Magnetic field measurement; Magnetic liquids; Magnetic properties; Millimeter wave measurements; Millimeter wave propagation; Polarization; Tellurium; Temperature measurement; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 1999. Eighteenth International Conference on
  • Conference_Location
    Baltimore, MD, USA
  • ISSN
    1094-2734
  • Print_ISBN
    0-7803-5451-6
  • Type

    conf

  • DOI
    10.1109/ICT.1999.843418
  • Filename
    843418