• DocumentCode
    2008041
  • Title

    Supporting a family of test program languages using a single open markup language

  • Author

    Wegener, Steven A.

  • Author_Institution
    Boeing Co., St. Louis, MO, USA
  • fYear
    2011
  • fDate
    12-15 Sept. 2011
  • Firstpage
    347
  • Lastpage
    353
  • Abstract
    Having a single structure for representing test program data is the cornerstone for a common architecture of a modular system that includes test program development, test program data collection, test program execution, collection of runtime data and interaction with intelligent sequencers. A common open markup language leads to common tools for data collection, test program editing, and a common runtime engine. Boeing has a fielded, open and scalable format currently supporting a single test program language. This paper will examine the use of this structure for storing other test program languages and how it fits into a common architecture approach. Presented is the concept of a simplified notation for automated test system programs (SNAP) that is human-readable yet easily converted to machine-readable extensible markup language (XML).
  • Keywords
    XML; program testing; Boeing; machine readable extensible markup language; runtime data collection; runtime engine; simplified notation for automated test system programs; single open markup language; test program data collection; test program development; test program editing; test program execution; test program languages; Context; Data structures; Instruments; Libraries; Runtime; Software; XML; ARCHITECTURE; COMMON; IEEE-1641; LANGUAGE; OPEN; SNAP; TPML; TPS; XML;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2011 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-9362-3
  • Type

    conf

  • DOI
    10.1109/AUTEST.2011.6058753
  • Filename
    6058753