• DocumentCode
    2008320
  • Title

    Common RF test platform

  • Author

    Hooper, Rich ; Shuffield, Doug ; Merchant, Ketan ; Savage, David

  • Author_Institution
    AAI Corp., A Textron Syst. Co., Hunt Valley, MD, USA
  • fYear
    2011
  • fDate
    12-15 Sept. 2011
  • Firstpage
    40
  • Lastpage
    46
  • Abstract
    A wide range of Radio Frequency (RF) assemblies require testing during their development and production. These include amplifiers, mixers, filters, up converters, down converters, antennas, phase shifters, power dividers, power combiners, Integrated Master Assemblies (IMAs), Weapons Replaceable Assemblies (WRAs), Line Replaceable Units (LRUs) and radio subassemblies. Though there are many differences between the RF assemblies, they all require a test system that is accurate, reliable and traceable while simultaneously minimizing test times. Other important attributes of a test platform for RF assemblies are that it must be calibrated, fully-characterized and incorporate self-test functionality. The test platform must also include a digital control solution for triggering, communicating with Units Under Test (UUT) and interfacing with handlers, fixtures, etc. Finally, the software for the test equipment must also be considered. Typical software functionality would include sequencing, reporting, testing, calibration, and self-test. While it is certainly possible to develop a test system specific to each type of RF assembly; there are many benefits to developing a common RF test platform that includes the functionality listed above.
  • Keywords
    automatic test equipment; automatic test software; automatic testing; RF test; digital control; radiofrequency assemblies; self-test functionality; test equipment; triggering; units under test; Frequency measurement; Instruments; Measurement uncertainty; Pulse measurements; Radio frequency; Time measurement; Uncertainty; Automated Test Equipment; RF; Radio Frequency; common platform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2011 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-9362-3
  • Type

    conf

  • DOI
    10.1109/AUTEST.2011.6058766
  • Filename
    6058766