DocumentCode
2009312
Title
Crosstalk induced fault analysis in DRAMs
Author
Mourad, S.
fYear
2004
fDate
12-15 Sept. 2004
Firstpage
171
Lastpage
172
Abstract
In this paper we focus on the analysis of crosstalk among the bit-lines during the read operation, especially when defect and parameter variations exist. We identify such faults as crosstalk reading (CTR) faults. An analytical study of these faults was done and we supported the study with extensive simulation results.
Keywords
DRAM chips; crosstalk; fault simulation; DRAM; RAM circuit; bit lines; crosstalk induced fault analysis; crosstalk reading faults; defect; parameter variations; read operation; simulation; Analytical models; Bismuth; Circuit faults; Crosstalk; Equivalent circuits; Integrated circuit interconnections; Integrated circuit noise; Latches; Random access memory; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference, 2004. Proceedings. IEEE International
Print_ISBN
0-7803-8445-8
Type
conf
DOI
10.1109/SOCC.2004.1362395
Filename
1362395
Link To Document