Title :
Pseudo Random Access Memory System With CCD-SR And MOS RAM On A Chip
Author :
Ohno, Naoya ; Hakozaki, Katsuya
Author_Institution :
Nippon Electric Co., Ltd.
Keywords :
Charge coupled devices; Costs; Hardware; Laboratories; Phase change random access memory; Random access memory; Read-write memory; Shift registers; Strontium; System performance;
Conference_Titel :
COMPCON Fall '77
DOI :
10.1109/CMPCON.1977.680817
