Title :
Session TA2: Design for Testability and Reliability
Abstract :
Start of the above-titled section of the conference proceedings record.
Conference_Titel :
SOC Conference, 2004. Proceedings. IEEE International
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-7803-8445-8
DOI :
10.1109/SOCC.2004.1362412
