A Self-Amplifying Four-Transistor MOSFET Mismatch Test Structure

Mismatch can be difficult to monitor in a production test environment as it can be small and, therefore, it requires precise, time-consuming, costly measurements. This paper describes a four-transistor test structure for measurement and characterization of MOS transistor mismatch that self-amplifies the effect of mismatch, thereby generating a large and easily measurable dc output voltage. Test and design aspects of the structure are detailed, and several additional applications of the new structure are described.