• DocumentCode
    2009918
  • Title

    A leakage-tolerant low-leakage register file with conditional sleep transistor

  • Author

    Agarwal, Abhishek ; Kaushik, Rajashekara ; Krishnamurthy, Ram K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2004
  • fDate
    12-15 Sept. 2004
  • Firstpage
    241
  • Lastpage
    244
  • Abstract
    This paper describes a 256×64b 3-read, 3-write ported leakage tolerant low leakage register file. The local bitline shares a sleep transistor for aggressive bitline leakage reduction/tolerance to enable high fanin bitlines and uses low Vth transistors. The sleep transistor is turned on while accessing the local bitline and conditionally turned off, if the dynamic node should remain high. Simulation results shows that proposed technique achieves 9% improvement in performance with 14× reduction in local bitline leakage (97× reduction as compared to any previously proposed low Vth, leakage tolerant register file) enabling 70% reduction in keeper size, while keeping the same noise robustness as optimized high performance conventional high Vth implementation.
  • Keywords
    integrated circuit design; leakage currents; logic circuits; logic design; transistors; 3-read ported register file; 3-write ported register file; aggressive bitline leakage reduction; aggressive bitline leakage tolerance; conditional sleep transistor; dynamic node; high fanin bitlines; keeper size reduction; leakage tolerant register file; leakage-tolerant low-leakage register file; local bitline leakage; CMOS technology; Circuit noise; Clocks; Decoding; Delay; Noise reduction; Noise robustness; Registers; Signal generators; Sleep;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference, 2004. Proceedings. IEEE International
  • Print_ISBN
    0-7803-8445-8
  • Type

    conf

  • DOI
    10.1109/SOCC.2004.1362421
  • Filename
    1362421