DocumentCode
2009918
Title
A leakage-tolerant low-leakage register file with conditional sleep transistor
Author
Agarwal, Abhishek ; Kaushik, Rajashekara ; Krishnamurthy, Ram K.
Author_Institution
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear
2004
fDate
12-15 Sept. 2004
Firstpage
241
Lastpage
244
Abstract
This paper describes a 256×64b 3-read, 3-write ported leakage tolerant low leakage register file. The local bitline shares a sleep transistor for aggressive bitline leakage reduction/tolerance to enable high fanin bitlines and uses low Vth transistors. The sleep transistor is turned on while accessing the local bitline and conditionally turned off, if the dynamic node should remain high. Simulation results shows that proposed technique achieves 9% improvement in performance with 14× reduction in local bitline leakage (97× reduction as compared to any previously proposed low Vth, leakage tolerant register file) enabling 70% reduction in keeper size, while keeping the same noise robustness as optimized high performance conventional high Vth implementation.
Keywords
integrated circuit design; leakage currents; logic circuits; logic design; transistors; 3-read ported register file; 3-write ported register file; aggressive bitline leakage reduction; aggressive bitline leakage tolerance; conditional sleep transistor; dynamic node; high fanin bitlines; keeper size reduction; leakage tolerant register file; leakage-tolerant low-leakage register file; local bitline leakage; CMOS technology; Circuit noise; Clocks; Decoding; Delay; Noise reduction; Noise robustness; Registers; Signal generators; Sleep;
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference, 2004. Proceedings. IEEE International
Print_ISBN
0-7803-8445-8
Type
conf
DOI
10.1109/SOCC.2004.1362421
Filename
1362421
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