DocumentCode
2010639
Title
IEEE Std 4 "High voltage testing techniques" past, present and future IEEE/PES/PSIM High Voltage Testing Techniques Subcommittee Report
Author
Larzelere, Bill ; Loving, Kevin ; Daharsh, Ross ; Kise, John ; McComb, Terry ; Hanique, Ernst ; Britton, Jeffrey ; Molden, Arthur ; Holst, Barry ; Coffeen, Larry ; McQuin, Nigel ; Nichols, Dave ; Dufield, Dana ; Newnam, Randy ; Schneider, Herman ; Fitzpat
Volume
2
fYear
2001
fDate
2-2 Nov. 2001
Firstpage
1064
Lastpage
1069
Keywords
Atmospheric measurements; Contamination; Dielectric loss measurement; Dielectric losses; Dielectric measurements; IEC standards; Measurement standards; Pollution measurement; Testing; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Transmission and Distribution Conference and Exposition, 2001 IEEE/PES
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-7285-9
Type
conf
DOI
10.1109/TDC.2001.971399
Filename
971399
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