DocumentCode
2010684
Title
The development of low frequency RF generator for dry scrubber
Author
Soo-Seok Kim ; Dae-Kyu Choi
Author_Institution
Dept. of Electr. Eng., Seoul Nat. Univ., South Korea
fYear
2003
fDate
5-5 June 2003
Firstpage
140
Abstract
Summary form only given, as follows. Chemical vapor deposition reactors are widely used in the semiconductor industry for making insulating, semiconductive and conducting films in wafer fabrication. Dry scrubber system is to treat exhaust gases in semiconductor processing. Plasma is generated inside the electrode where the surface area to the plasma volume ration is high and the flow path is long. When process exhaust gases enter the dry scrubber system, they are forced to pass through the plasma region where energized electrons and ions collide with gas molecules and particles, generating reactive species, which react on expanded electrode surfaces. Solid components and particles are deposited on the electrode surfaces as dense films without reaction on the flow path and neutralized gases are pumped downstream. In this paper, we have studied on the low frequency RF generator for dry scrubber system. The main power stage of low frequency RF generator is used for the FB PWM inverter with an LC filter in the secondary circuit of the transformer. The operation of the Low frequency RF generator is identified. For this, we divided a switching period into six topological modes. 1500kW, 100kHz Low Frequency RF generator is designed and tested. Also, manual matching transformer provides an impedance match for any given process related variation in impedance. The operation characteristics of low frequency RF generator are verified by simulation and experimental results.
Keywords
PWM invertors; impedance matching; plasma CVD; power supplies to apparatus; semiconductor growth; 100 kHz; 1500 kW; LC filter; PWM inverter; chemical vapor deposition reactors; dry scrubber system; impedance match; low frequency RF generator; manual matching transformer; process exhaust gases; semiconductor processing; simulation; topological modes; Chemical vapor deposition; Electrodes; Gases; Impedance; Inductors; Plasma applications; Plasma chemistry; Plasma materials processing; Power transformer insulation; Radio frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2003. ICOPS 2003. IEEE Conference Record - Abstracts. The 30th International Conference on
Conference_Location
Jeju, South Korea
ISSN
0730-9244
Print_ISBN
0-7803-7911-X
Type
conf
DOI
10.1109/PLASMA.2003.1228567
Filename
1228567
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