Title :
A possible application of the non-uniform electric field measurement using Pockels effect in GIS (gas insulated switchgear)
Author :
Ja-Yoon Koo ; Cheol-hwi Ryu ; Yong-moo Chang
Author_Institution :
Dept. of Electr. Eng, Hanyang Univ., Seoul, South Korea
Abstract :
Summary form only given, as follows. In this paper, a novel optical measuring system for the measuring of non-uniform electric field was proposed. The first feasibility investigation on the probe sensor, based on the Pockels cell, has been performed to measure the variation of the electric field due to the corona discharges. The aim of this work is to develop a chip type electric field sensor which would be applicable to the EHV power apparatus in the future. For this purpose, optical measurement system was constructed and test cells and probe sensor were designed and fabricated. The electric field distorted by the discharge was detected through proposed optical measuring system based on the Pockels effect at GIS. In order to produce distorted electric field, corona discharge was generated from needle-plane electrode on the conductor at GIS in air and detected by optical measuring system. This optical system is constructed by He-Ne laser, single mode optical fiber, 2/spl times/2 50/50 beam splitter, LiNbO/sub 3/, Pockels cell, photodetector and PC. In this system, output signals of Pockels sensor is measured by the digital oscilloscope and transferred to the PC for recording and statistical processing. Through this paper, promising possibilities of proto-type optical measuring system were evinced.
Keywords :
Pockels effect; corona; electric field measurement; electro-optical devices; gas insulated switchgear; He-Ne laser; Pockels cell; Pockels effect; beam splitter; chip type electric field sensor; corona discharges; distorted electric field; gas insulated switchgear; nonuniform electric field measurement; optical measuring system; probe sensor; single mode optical fiber; Distortion measurement; Electric variables measurement; Gas insulation; Geographic Information Systems; Nonuniform electric fields; Optical distortion; Optical recording; Optical sensors; Semiconductor device measurement; Switchgear;
Conference_Titel :
Plasma Science, 2003. ICOPS 2003. IEEE Conference Record - Abstracts. The 30th International Conference on
Conference_Location :
Jeju, South Korea
Print_ISBN :
0-7803-7911-X
DOI :
10.1109/PLASMA.2003.1228585