• DocumentCode
    2011107
  • Title

    VLSI testing based security metric for IC camouflaging

  • Author

    Rajendran, Jeyavijayan ; Sinanoglu, Ozgur ; Karri, Ramesh

  • Author_Institution
    New York Univ., Abu Dhabi, United Arab Emirates
  • fYear
    2013
  • fDate
    6-13 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    An Integrated Circuit (IC) can be reverse engineered by imaging its layout and reconstructing the netlist. IC camouflaging is a layout-level technique that hampers imaging-based reverse engineering by using, in one embodiment, functionally different standard cells that look alike. Reverse engineering will fail if the functionality of a camouflaged gate cannot be correctly resolved. We adapt VLSI testing principles (justification and sensitization) to quantify the ability of a reverse engineer to unambiguously resolve the functionality of look-alike camouflaged gates. We evaluate the security of look-alike standard cells based IC camouflaging by applying it on the controllers in OpenSPARC T1 processor.
  • Keywords
    VLSI; integrated circuit layout; integrated circuit testing; reverse engineering; IC camouflaging; OpenSPARC T1 processor; VLSI testing based security metric; camouflaged gate; integrated circuit; layout-level technique; reverse engineering; Force; Integrated circuits; Layout; Logic gates; Metals; Reverse engineering; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2013 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2013.6651879
  • Filename
    6651879