• DocumentCode
    2011758
  • Title

    A wavelet neural network framework for diagnostics of complex engineered systems

  • Author

    Vachtsevanos, George ; Wang, Peng ; Echauz, Javier

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    79
  • Lastpage
    84
  • Abstract
    This paper introduces a new model-free diagnostic methodology to detect and identify machine failures and product defects. The basic module of the methodology is a novel multidimensional wavelet neural network construct used as the failure mode classifier. Validated sensor data are preprocessed and a vector of appropriate features is extracted. The feature vector becomes the input to the wavelet neural network which is trained off-line to map features to failure causes. An example is employed to illustrate the robustness and effectiveness of the proposed scheme
  • Keywords
    diagnostic expert systems; fault diagnosis; feature extraction; neural nets; pattern classification; stability; wavelet transforms; complex engineered system diagnostics; failure mode classifier; feature vector extraction; machine failure detection; machine failure identification; model-free diagnostic methodology; multidimensional wavelet neural network; preprocessing; product defect detection; product defect identification; robustness; validated sensor data; Data mining; Fault detection; Feature extraction; Filters; Neural networks; Robustness; Sensor phenomena and characterization; Sequential analysis; Systems engineering and theory; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control, 2001. (ISIC '01). Proceedings of the 2001 IEEE International Symposium on
  • Conference_Location
    Mexico City
  • ISSN
    2158-9860
  • Print_ISBN
    0-7803-6722-7
  • Type

    conf

  • DOI
    10.1109/ISIC.2001.971488
  • Filename
    971488