Title :
A wavelet neural network framework for diagnostics of complex engineered systems
Author :
Vachtsevanos, George ; Wang, Peng ; Echauz, Javier
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper introduces a new model-free diagnostic methodology to detect and identify machine failures and product defects. The basic module of the methodology is a novel multidimensional wavelet neural network construct used as the failure mode classifier. Validated sensor data are preprocessed and a vector of appropriate features is extracted. The feature vector becomes the input to the wavelet neural network which is trained off-line to map features to failure causes. An example is employed to illustrate the robustness and effectiveness of the proposed scheme
Keywords :
diagnostic expert systems; fault diagnosis; feature extraction; neural nets; pattern classification; stability; wavelet transforms; complex engineered system diagnostics; failure mode classifier; feature vector extraction; machine failure detection; machine failure identification; model-free diagnostic methodology; multidimensional wavelet neural network; preprocessing; product defect detection; product defect identification; robustness; validated sensor data; Data mining; Fault detection; Feature extraction; Filters; Neural networks; Robustness; Sensor phenomena and characterization; Sequential analysis; Systems engineering and theory; Uncertainty;
Conference_Titel :
Intelligent Control, 2001. (ISIC '01). Proceedings of the 2001 IEEE International Symposium on
Conference_Location :
Mexico City
Print_ISBN :
0-7803-6722-7
DOI :
10.1109/ISIC.2001.971488