DocumentCode :
2012041
Title :
AgentDiag: An agent-assisted diagnostic framework for board-level functional failures
Author :
Zelong Sun ; Li Jiang ; Qiang Xu ; Zhaobo Zhang ; Zhiyuan Wang ; Xinli Gu
Author_Institution :
Chinese Univ. of Hong Kong, Hong Kong, China
fYear :
2013
fDate :
6-13 Sept. 2013
Firstpage :
1
Lastpage :
8
Abstract :
Diagnosing functional failures in complicated electronic boards is a challenging task, wherein debug technicians try to identify defective components by analyzing some syndromes obtained from the application of diagnostic tests. The diagnosis effectiveness and efficiency rely heavily on the quality of the in-house developed diagnostic tests and the debug technicians´ knowledge and experience, which, however, have no guarantees nowadays. To tackle this problem, we propose a novel agent-assisted diagnostic framework for board-level functional failures, namely AgentDiag, which facilitates to evaluate the quality of the diagnostic tests and bridge the knowledge gap between the diagnostic programmers who write diagnostic tests and the debug technicians who conduct in-field diagnosis with a lightweight model of the boards and tests. Experimental results on a real industrial board and an OpenRISC design demonstrate the effectiveness of the proposed solution.
Keywords :
VLSI; electronic engineering computing; failure analysis; fault diagnosis; integrated circuit testing; reduced instruction set computing; software agents; AgentDiag; OpenRISC design; agent-assisted diagnostic framework; board lightweight model; board-level functional failures; complicated electronic boards; debug technician knowledge-experience; debug technicians; defective components; diagnosis effectiveness; diagnosis efficiency; diagnostic programmers; diagnostic test quality; functional failure diagnosis; in-field diagnosis; test lightweight model; Accuracy; Data models; Engines; Equations; Mathematical model; Support vector machines; Training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2013 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2013.6651918
Filename :
6651918
Link To Document :
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