DocumentCode
2012123
Title
Residual conductivity and Seebeck coefficient calculations in TiCo1-xCuxSb alloys
Author
Stopa, T. ; Tobola, J. ; Kaprzyk, S.
Author_Institution
Fac. of Phys. & Appl. Comput. Sci., AGH Univ. of Sci. & Technol., Krakow
fYear
2006
fDate
6-10 Aug. 2006
Firstpage
132
Lastpage
135
Abstract
We report results of conductivity and Seebeck coefficient calculations for TiCo1-xCuxSb alloys, as well as their comparison with experimental data. TiCoSb crystallizes in a half-Heusler crystal structure. As revealed from experimental measurements by Horyn et al., this type of structure does not change with Cu doping until x = 0.5. Moreover, lattice constant changes also very slightly and not-monotonically for 0 < x < 0.5, varying less then 0.001 nm. Therefore, we decided to use fixed lattice constant a = 0.58819 nm for all Cu concentrations. In TiCo1-xCuxSb a semiconductor-metal phase transition is observed upon even very small Cu doping. This is connected with the fact, that Fermi level in TiCoSb is located at the top of valence band. When the number of electrons in the system grows, Fermi energy crosses energy gap (which is about 1 eV) and enters conduction band. Also Seebeck coefficient increases rapidly with x from about -350 muV/K in TiCoSb to almost zero for x = 0.5, but it doesn´t change the sign. All calculations were performed within Korringa-Kohn-Rostoker (KKR) method [Bansil et al., 1990 and 1999] with coherent potential approximation (CPA) [Soven, 1967] and [Kaprzyk and Bansil, 1990]
Keywords
Fermi level; KKR calculations; Seebeck effect; antimony alloys; cobalt alloys; copper alloys; crystal structure; electrical conductivity transitions; lattice constants; titanium alloys; Fermi energy; Fermi level; Korringa-Kohn-Rostoker method; Seebeck coefficient; TiCoCuSb; coherent potential approximation; copper concentration; crystallization; energy gap; half-Heusler crystal structure; lattice constant; residual conductivity; semiconductor-metal phase transition; Computer science; Conductivity; Crystallization; Dispersion; Electrons; High performance computing; Lattices; Linear discriminant analysis; Physics; Semiconductor device doping;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 2006. ICT '06. 25th International Conference on
Conference_Location
Vienna
ISSN
1094-2734
Print_ISBN
1-4244-0811-3
Electronic_ISBN
1094-2734
Type
conf
DOI
10.1109/ICT.2006.331298
Filename
4133254
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