DocumentCode :
2012130
Title :
Accurate full spectrum test robust to simultaneous non-coherent sampling and amplitude clipping
Author :
Sudani, Siva ; Li Xu ; Degang Chen
Author_Institution :
Iowa State Univ., Ames, IA, USA
fYear :
2013
fDate :
6-13 Sept. 2013
Firstpage :
1
Lastpage :
10
Abstract :
For spectral testing of Built-in Self-Test Analog to Digital Converters, it is a very challenging task to precisely control the amplitude and frequency of input sinusoid signal. Amplitude over-range results in clipping ADC output and non-coherent sampling results in spectral leakage. In this paper, a new method is proposed that provides accurate spectral results even when the input to ADC is both over-ranged and non-coherently sampled. This relaxes the condition to have precise control over the input signal and thus decreases the cost. The method includes fundamental identification, removal and residue interpolation to obtain accurate spectral results. Simulations show the functionality and robustness of proposed method with both non-coherency and amplitude over-range. Measurement results of a commercially available 16-bit SAR ADC are used to verify the method for both functionality and robustness.
Keywords :
analogue-digital conversion; built-in self test; circuit testing; ADC output clipping; SAR ADC; amplitude clipping; amplitude overrange; built-in self-test analog to digital converters; full spectrum test; input sinusoid signal; residue interpolation; simultaneous noncoherent sampling; spectral leakage; spectral testing; word length 16 bit; Built-in self-test; Discrete Fourier transforms; Equations; Harmonic analysis; Interpolation; Noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2013 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2013.6651920
Filename :
6651920
Link To Document :
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