• DocumentCode
    2012159
  • Title

    Author index

  • fYear
    2000
  • fDate
    30-30 April 2000
  • Firstpage
    82
  • Lastpage
    82
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect Based Testing, 2000. Proceedings. 2000 IEEE International Workshop on
  • Conference_Location
    Montreal, Que., Canada
  • Print_ISBN
    0-7695-0637-2
  • Type

    conf

  • DOI
    10.1109/DBT.2000.843695
  • Filename
    843695
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2012159