Title :
A Novel Encoding Scheme for Delay and Energy Minimization in VLSI Interconnects with Built-In Error Detection
Author :
Avinash, Lingamneni ; Krishna, M. Kirthi ; Srinivas, M.B.
Author_Institution :
Centre for VLSI & Embedded Syst. Technol., Int. Inst. of Inf. Technol., Hyderabad
Abstract :
In deep sub-micron (DSM) technology, crosstalk noise and logic faults caused due to shrinking wire-size and reduced inter-wire spacing are major factors affecting the performance of on-chip interconnects such as high power consumption and increased delay. In this paper, a novel spatio-temporal bus encoding scheme to minimize the crosstalk in interconnects is proposed that simultaneously addresses error detection requirement also. The proposed scheme eliminates crosstalk classes 4, 5 and 6 among the interconnect wires, thereby reducing delay and energy consumption. Also, the proposed scheme has the feature of built-in error detection without any performance overhead. The effectiveness of the proposed technique is evaluated by focusing on L1 cache address/data bus of a microprocessor using SPEC2000 CINT benchmark suites for 90 nm and 65 nm technologies. The proposed technique achieves an efficiency of 11% in energy consumption and a reduction of about 33% to 63% in delay when compared to the base case for data transmission and is shown to perform better than the existing bus encoding schemes in literature.
Keywords :
VLSI; crosstalk; error detection; integrated circuit interconnections; microprocessor chips; VLSI interconnects; built-in error detection; crosstalk noise; deep sub-micron technology; delay minimization; energy minimization; error detection requirement; logic faults; microprocessor; spatio-temporal bus encoding; Analytical models; Capacitance; Crosstalk; Electromagnetic interference; Encoding; Energy consumption; Error correction; Integrated circuit interconnections; Propagation delay; Very large scale integration; Bus coding; Crosstalk; Deep submicron; Error detection; Interconnects;
Conference_Titel :
Symposium on VLSI, 2008. ISVLSI '08. IEEE Computer Society Annual
Conference_Location :
Montpellier
Print_ISBN :
978-0-7695-3291-2
Electronic_ISBN :
978-0-7695-3170-0
DOI :
10.1109/ISVLSI.2008.51