• DocumentCode
    2012183
  • Title

    Integrated correction for Cone-Beam Computed Tomography artifacts based on Digital Radiography model

  • Author

    Huang, Kuidong ; Zhang, Dinghua ; Li, Mingjun ; Wang, Kuyu

  • Author_Institution
    Key Lab. of Contemporary Design & Integrated Manuf. Technol., Northwestern Polytech. Univ., Xi´´an
  • fYear
    2009
  • fDate
    11-12 May 2009
  • Firstpage
    100
  • Lastpage
    104
  • Abstract
    The main manifestations of artifacts and their causes in cone-beam computed tomography (CBCT) system were studied, and then the general CBCT digital radiography (DR) imaging model was described with a mathematical expression. On this basis, a new expression of DR imaging model was proposed according to the actual imaging noise and enforceability of corrective action, and so the projection image was decomposed into dark field, gain, scattering and transmission. According to the model, the integrated projection image artifact corrections were processed on the order of dark field correction, gain non-uniformity correction, scattering correction and beam hardening correction, to avoid the one-sidedness of only correcting a certain kind of artifact. Experimental result shows that the method can basically eliminate the artifacts caused by DR imaging in the CBCT system.
  • Keywords
    computerised tomography; radiography; CBCT digital radiography model; beam hardening correction; cone-beam computed tomography artifacts; dark field correction; gain non-uniformity correction; imaging noise; mathematical expression; scattering correction; Computed tomography; Light scattering; Mathematical model; Object detection; Optical imaging; Optical scattering; Radiography; Rayleigh scattering; Signal processing; X-ray scattering; Cone-Beam Computed Tomography; DR model; artifact correction; beam hardening; flat panel detector; scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imaging Systems and Techniques, 2009. IST '09. IEEE International Workshop on
  • Conference_Location
    Shenzhen
  • Print_ISBN
    978-1-4244-3482-4
  • Electronic_ISBN
    978-1-4244-3483-1
  • Type

    conf

  • DOI
    10.1109/IST.2009.5071611
  • Filename
    5071611