DocumentCode :
2012418
Title :
Fabrication of carbon nanomechanical resonators with embedded single walled carbon nanotube stiffening layers
Author :
Lee, Seung Hoon ; Min, Bumki ; Park, Se Il ; Lee, Kwang-Cheol ; Lee, Seung S.
Author_Institution :
Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fYear :
2010
fDate :
24-28 Jan. 2010
Firstpage :
268
Lastpage :
271
Abstract :
This study presents a new fabrication method for high frequency nanomechanical resonators by utilizing carbon layers with embedded single walled carbon-nanotube layers. The carbon layers, fabricated by pyrolysis of photo- or electron beam resists, showed low-density and moderate Young´s modulus which is suitable to sensitive nanodevices. The carbon-nanotube layers underneath carbon layers enhanced conductivity and Young´s modulus while maintaining low-density of carbon nanoresonators. These two layers are fashioned into doubly clamped nanomechanical beams by electron beam lithography and carbon dry etching processes. Dynamic behaviors such as resonant frequency and Q-factor are investigated using magnetomotive detection method.
Keywords :
Q-factor; Young´s modulus; carbon nanotubes; electron beam lithography; etching; nanoelectromechanical devices; nanofabrication; nanolithography; photoresists; pyrolysis; resonators; C; Q-factor; Young modulus; carbon dry etching process; carbon nanomechanical resonator fabrication; doubly clamped nanomechanical beam; electron beam lithography; electron beam resists; embedded single walled carbon nanotube stiffening layer; high frequency nanomechanical resonator; magnetomotive detection method; photoresists; pyrolysis; resonant frequency; Carbon nanotubes; Conductivity; Dry etching; Electron beams; Fabrication; Lithography; Magnetic resonance; Q factor; Resists; Resonant frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2010 IEEE 23rd International Conference on
Conference_Location :
Wanchai, Hong Kong
ISSN :
1084-6999
Print_ISBN :
978-1-4244-5761-8
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2010.5442515
Filename :
5442515
Link To Document :
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