Title : 
A fully packaged piezoelectric switch with lowvoltage actuation and electrostatic hold
         
        
            Author : 
Cueff, Matthieu ; Defaÿ, Emmanuël ; Rey, Patrice ; Le Rhun, Gwenaël ; Perruchot, François ; Ferrandon, Christine ; Mercier, Denis ; Domingue, Frédéric ; Suhm, Aurélien ; Aid, M. ; Liu, Lianjiu ; Pacheco, Sergio ; Miller, Mel
         
        
            Author_Institution : 
Leti, CEA, Grenoble, France
         
        
        
        
        
        
            Abstract : 
This paper reports RF characterization of a fully packaged RF MEMS piezoelectric switch. The switch demonstrates better than 0.8 dB insertion loss at 2 GHz and 30 dB isolation up to 10 GHz. The presented device combines a piezoelectric actuation and a low electrostatic hold voltage to improve contact force. Actuation voltages of the switch are 5 V for both piezoelectric actuation and electrostatic hold. This actuation was sufficient to obtain contact resistance lower than 2 ohms. The switch is packaged by wafer-level packaging technology using gap control, AuSn eutectic bonding and post-process Thru-Silicon Vias.
         
        
            Keywords : 
contact resistance; electrostatics; gold compounds; microswitches; piezoelectric devices; wafer level packaging; AuSn; contact force; contact resistance; eutectic bonding; frequency 2 GHz; fully packaged RF MEMS piezoelectric switch; gap control; insertion loss; low electrostatic hold voltage; low-voltage actuation; piezoelectric actuation; thru-silicon vias; voltage 5 V; wafer-level packaging technology; Contact resistance; Electrostatics; Insertion loss; Low voltage; Packaging; Radio frequency; Radiofrequency microelectromechanical systems; Switches; Wafer bonding; Wafer scale integration;
         
        
        
        
            Conference_Titel : 
Micro Electro Mechanical Systems (MEMS), 2010 IEEE 23rd International Conference on
         
        
            Conference_Location : 
Wanchai, Hong Kong
         
        
        
            Print_ISBN : 
978-1-4244-5761-8
         
        
            Electronic_ISBN : 
1084-6999
         
        
        
            DOI : 
10.1109/MEMSYS.2010.5442529