• DocumentCode
    2012767
  • Title

    Mechanically flexible double gate a-IGZO TFTs

  • Author

    Münzenrieder, Niko ; Zysset, Christoph ; Kinkeldei, Thomas ; Petti, Luisa ; Salvatore, Giovanni A. ; Tröster, Gerhard

  • Author_Institution
    Inst. for Electron., Swiss Fed. Inst. of Technol. Zurich, Zurich, Switzerland
  • fYear
    2012
  • fDate
    17-21 Sept. 2012
  • Firstpage
    133
  • Lastpage
    136
  • Abstract
    In this paper, the concept of double gate transistors is applied to mechanically flexible amorphous Indium-Gallium-Zinc-Oxide (a-IGZO) thin film transistors (TFTs) fabricated on free standing plastic foils. Due to the temperature sensitivity of the plastic substrate, a-IGZO is a suitable semiconductor since it provides carrier mobilities of ~ 10 cm2/Vs when deposited at room temperature. Double gate TFTs with connected bottom and top gate are compared to bottom gate reference TFTs fabricated on the same substrate. Double gate a-IGZO TFTs exhibit a by 74% increased gate capacitance, a by 0,7 V higher threshold voltage, and therefore an up to 51% increased transconductance. The subthreshold swing and the on/off current ratios are improved as well, and reach excellent values of 69 mV/dec and 2×109, respectively. The mechanical flexibility is demonstrated by showing device operation while the TFT is exposed to tensile strain of 0.55%, induced by bending to a radius of 5 mm.
  • Keywords
    amorphous semiconductors; gallium compounds; indium compounds; thin film transistors; zinc compounds; carrier mobility; double gate TFT; double gate transistor; flexible amorphous indium-gallium-zinc-oxide; flexible double gate a-IGZO TFT; free standing plastic foils; gate capacitance; mechanical flexibility; plastic substrate; size 5 mm; temperature sensitivity; tensile strain; thin film transistor; transconductance; Aluminum oxide; Capacitance; Logic gates; Substrates; Thin film transistors; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference (ESSDERC), 2012 Proceedings of the European
  • Conference_Location
    Bordeaux
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4673-1707-8
  • Electronic_ISBN
    1930-8876
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2012.6343351
  • Filename
    6343351