DocumentCode :
2013495
Title :
Orderly Random Testing for Both Hardware and Software
Author :
Xu, Shiyi
Author_Institution :
Shanghai Univ., Shanghai, China
fYear :
2008
fDate :
15-17 Dec. 2008
Firstpage :
160
Lastpage :
167
Abstract :
Based on random testing, this paper introduces a new concept of orderly random testing for both hardware and software systems. Random testing, having been employed for years, seems to be inefficient for its random selection of test patterns. Therefore, a new concept of pre-determined distance among test vectors is proposed in the paper to make it more effective in testing. The idea is based on the fact that the larger the distance between two adjacent test vectors in a test sequence, the more the faults will be detected by the test vectors. Procedure of constructing such a testing sequence is presented in detail. The new approach has shown its remarkable advantage of fitting in with both hardware and software testing. Experimental results and mathematical analysis are also given to evaluate the performances of the novel method.
Keywords :
computer testing; program testing; fault testing; hardware testing; orderly random testing; software testing; Circuit faults; Circuit testing; Fault detection; Hamming distance; Hardware; Random number generation; Software systems; Software testing; System testing; Test pattern generators; Black-box Testing; Cartesian Distance; Generation Matrix; Hamming Distance; Pre-determined Distance; Random Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dependable Computing, 2008. PRDC '08. 14th IEEE Pacific Rim International Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-0-7695-3448-0
Electronic_ISBN :
978-0-7695-3448-0
Type :
conf
DOI :
10.1109/PRDC.2008.7
Filename :
4725292
Link To Document :
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