• DocumentCode
    2014241
  • Title

    Hardware resource minimization for histogram-based ADC BIST

  • Author

    Renovell, M. ; Azaïs, F. ; Bernard, S. ; Bertrand, Y.

  • Author_Institution
    Lab. d´´Inf. Robotique Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    247
  • Lastpage
    252
  • Abstract
    The paper proposes a BIST approach for deriving the main characterization parameters of ADCs from histogram data. An adequate choice of input stimuli and time decomposition scheme is proposed in order to minimize the extra on-chip hardware required to extract these parameters. The idea of time decomposition consists in replacing classical hardware-consuming concurrent calculations by hardware-saving time-spread calculations. The decomposition technique is used both at high level (specific test phases are dedicated to each ADC parameter computation) and low level (sequential steps inside each test phase). Pseudo-algorithms are given to derive offset, gain error and nonlinearities
  • Keywords
    analogue-digital conversion; automatic testing; built-in self test; integrated circuit testing; network parameters; characterization parameters; gain error; hardware resource minimization; hardware-saving time-spread calculations; histogram-based ADC BIST; input stimuli; nonlinearities; offset; on-chip hardware; parameter computation; sequential steps; test phases; time decomposition scheme; Built-in self-test; Circuit testing; Data mining; Hardware; Hip; Histograms; Postal services; Robots; Tellurium; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2000. Proceedings. 18th IEEE
  • Conference_Location
    Montreal, Que.
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-0613-5
  • Type

    conf

  • DOI
    10.1109/VTEST.2000.843852
  • Filename
    843852