DocumentCode
2014241
Title
Hardware resource minimization for histogram-based ADC BIST
Author
Renovell, M. ; Azaïs, F. ; Bernard, S. ; Bertrand, Y.
Author_Institution
Lab. d´´Inf. Robotique Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
fYear
2000
fDate
2000
Firstpage
247
Lastpage
252
Abstract
The paper proposes a BIST approach for deriving the main characterization parameters of ADCs from histogram data. An adequate choice of input stimuli and time decomposition scheme is proposed in order to minimize the extra on-chip hardware required to extract these parameters. The idea of time decomposition consists in replacing classical hardware-consuming concurrent calculations by hardware-saving time-spread calculations. The decomposition technique is used both at high level (specific test phases are dedicated to each ADC parameter computation) and low level (sequential steps inside each test phase). Pseudo-algorithms are given to derive offset, gain error and nonlinearities
Keywords
analogue-digital conversion; automatic testing; built-in self test; integrated circuit testing; network parameters; characterization parameters; gain error; hardware resource minimization; hardware-saving time-spread calculations; histogram-based ADC BIST; input stimuli; nonlinearities; offset; on-chip hardware; parameter computation; sequential steps; test phases; time decomposition scheme; Built-in self-test; Circuit testing; Data mining; Hardware; Hip; Histograms; Postal services; Robots; Tellurium; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location
Montreal, Que.
ISSN
1093-0167
Print_ISBN
0-7695-0613-5
Type
conf
DOI
10.1109/VTEST.2000.843852
Filename
843852
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