Title : 
Using arithmetic transform for verification of datapath circuits via error modeling
         
        
            Author : 
Radecka, Katarzyna ; Zilic, Zeljko
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, Que., Canada
         
        
        
        
        
        
            Abstract : 
In this paper, we consider verification under error-model assumption. We exploit the algebraic properties of the arithmetic transforms that are used in compact graph-based representations of arithmetic circuits, such as *BMDs. Verification time can be shortened under the assumption of corrupting a bounded number of transform coefficients. Bounds are derived for a number of test vectors, and the vectors successfully verified arithmetic circuits under a class of error models derived from recently proposed basic design error classes, including single stuck-at faults
         
        
            Keywords : 
application specific integrated circuits; decision diagrams; fault diagnosis; graph theory; integrated circuit testing; logic testing; transforms; *BMDs; algebraic properties; arithmetic circuits; arithmetic transform; compact graph-based representations; datapath circuits; error modeling; single stuck-at faults; test vectors; transform coefficients; verification time; Arithmetic; Boolean functions; Circuit faults; Computer errors; Data structures; Delay; Libraries; Microprocessors; Polynomials; Testing;
         
        
        
        
            Conference_Titel : 
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
         
        
            Conference_Location : 
Montreal, Que.
         
        
        
            Print_ISBN : 
0-7695-0613-5
         
        
        
            DOI : 
10.1109/VTEST.2000.843855