DocumentCode
2014343
Title
Functional memory faults: a formal notation and a taxonomy
Author
Van de Goor, Ad J. ; AL-Ars, Zaid
Author_Institution
Fac. of Inf. Technol. & Syst., Delft Univ. of Technol., Netherlands
fYear
2000
fDate
2000
Firstpage
281
Lastpage
289
Abstract
This paper presents a notation for describing functional fault models, which may occur in memory devices. Using this notation, the space of all possible memory faults has been constructed. It has been shown that this space is infinite, and contains the currently established fault models. New fault models in this space have been identified and verified using resistive and capacitive defect injection and simulation of a DRAM model
Keywords
DRAM chips; fault diagnosis; fault simulation; integrated circuit testing; DRAM model; capacitive defect injection; fault models; formal notation; functional memory faults; memory devices; memory faults; resistive defect injection; taxonomy; Automatic testing; Decoding; Electrical fault detection; Fault detection; Logic testing; Random access memory; Read only memory; Space exploration; System testing; Taxonomy;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location
Montreal, Que.
ISSN
1093-0167
Print_ISBN
0-7695-0613-5
Type
conf
DOI
10.1109/VTEST.2000.843856
Filename
843856
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