Title :
2-D thermal imaging of the optical power distribution in photonic integrated circuits
Author :
Lüerßen, Dietrich ; Ram, Rajeev J. ; Hudgings, Janice A.
Author_Institution :
Dept. of Phys., Mount Holyoke Coll., South Hadley, MA, USA
Abstract :
We present a surface imaging method that allows monitoring of the optical power distribution inside photonic integrated circuits. We demonstrate this technique on a semiconductor optical amplifier and compare results with direct optical measurements.
Keywords :
integrated optics; integrated optoelectronics; laser variables measurement; nondestructive testing; semiconductor optical amplifiers; thermoreflectance; 2D thermal imaging; monolithic integration; optical power distribution; photonic integrated circuits; semiconductor optical amplifier; surface imaging method; thermoreflectance imaging; Heat sinks; Integrated optics; Optical devices; Optical imaging; Optical modulation; Photonic integrated circuits; Power distribution; Semiconductor optical amplifiers; Stimulated emission; Temperature;
Conference_Titel :
Lasers and Electro-Optics Society, 2004. LEOS 2004. The 17th Annual Meeting of the IEEE
Print_ISBN :
0-7803-8557-8
DOI :
10.1109/LEOS.2004.1363161
