Title :
High-level observability for effective high-level ATPG
Author :
Corno, Fulvio ; Reorda, Matteo Sonza ; Squillero, Giovanni
Author_Institution :
Dipt. di Autom. e Inf., Politecnico di Torino, Italy
Abstract :
This paper focuses on observability, one of the open issues in high-level test generation. Three different approximate metrics for taking observability into account during RT-level ATPG are presented. Metrics range from a really naive and optimistic one to more sophisticated analysis. Metrics are evaluated including them in the calculation of the fitness function used in a RT-level ATPG. Advantages and disadvantages are illustrated. Experimental results show how sharp observability metrics are crucial for making effective RT-level ATPG possible: test sequences generated at RT-level outperform commercial gate-level ATPGs on some ITC99 benchmark circuits
Keywords :
application specific integrated circuits; automatic test pattern generation; integrated circuit testing; logic testing; observability; ITC99 benchmark circuits; RT-level ATPG; approximate metrics; effective high-level ATPG; fitness function; high-level observability; sharp observability metrics; test sequences; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit synthesis; Digital circuits; Hardware design languages; Logic testing; Observability; Test pattern generators;
Conference_Titel :
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7695-0613-5
DOI :
10.1109/VTEST.2000.843872
