Title :
Non intrusive fault detection through electromagnetism analysis
Author :
Thomas, Sébastien ; Regis, Didier ; Faura, David ; Gatti, Marc ; Duc, Guillaume ; Danger, Jean-Luc
Author_Institution :
Telecom ParisTech, Inst. Telecom, Paris, France
Abstract :
In this paper we introduce a fully non intrusive test method which is based on the Differential Electro-Magnetic Analysis (EMA). Our objective is to demonstrate the capability of this new method to detect stuck-at-0 faults voluntary injected in a full-custom circuit. This detection is carried out by comparing a reference trace, called Reference Signature, with a differential trace representing the observed electromagnetic activity. The results show the efficiency of the proposed method. We will then introduce the possibility offered by EM measurement to be used to detect degradation of physical parameters on equipments where no intrusions are allowed.
Keywords :
electromagnetism; fault diagnosis; field programmable gate arrays; integrated circuit reliability; logic testing; differential electromagnetism analysis; differential trace; field programmable gate arrays; integrated circuit reliability; nonintrusive fault detection; reference signature; reference trace; stuck-at-0 fault detection; Circuit faults; Databases; Electromagnetics; High definition video; Monitoring; Reliability; Sensors;
Conference_Titel :
Emerging Technologies & Factory Automation (ETFA), 2011 IEEE 16th Conference on
Conference_Location :
Toulouse
Print_ISBN :
978-1-4577-0017-0
Electronic_ISBN :
1946-0740
DOI :
10.1109/ETFA.2011.6059065