Title : 
Efficient diagnosis of single/double bridging faults with Delta Iddq probabilistic signatures and Viterbi algorithm
         
        
        
            Author_Institution : 
Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada
         
        
        
        
        
        
            Abstract : 
This paper presents an efficient method to diagnose single and double bridging faults. This method is based on Delta Iddq probabilistic signatures, as well as on the Viterbi algorithm, mainly used in telecommunications systems for error correction. The proposed method is a significant improvement over an existing one, based on maximum likelihood estimation. The (adapted) Viterbi algorithm takes into account useful information not considered previously. Simulation and experimental results are presented to validate the approach
         
        
            Keywords : 
CMOS logic circuits; Viterbi detection; automatic testing; circuit simulation; fault diagnosis; integrated circuit testing; logic testing; probability; CMOS; Delta Iddq probabilistic signatures; IC testing; Viterbi algorithm; simulation results; single/double bridging faults; Circuit faults; Circuit testing; Debugging; Error correction; Fault diagnosis; Maximum likelihood estimation; Microelectronics; Robustness; Silicon; Viterbi algorithm;
         
        
        
        
            Conference_Titel : 
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
         
        
            Conference_Location : 
Montreal, Que.
         
        
        
            Print_ISBN : 
0-7695-0613-5
         
        
        
            DOI : 
10.1109/VTEST.2000.843875