• DocumentCode
    2014945
  • Title

    Clustering based evaluation of IDDQ measurements: applications in testing and classification of ICs

  • Author

    Jandhyala, Sri ; Balachandran, Hari ; Sengupta, Manidip ; Jayasumana, Anura P.

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    444
  • Lastpage
    449
  • Abstract
    Effectiveness of the clustering based approach in detecting devices with abnormal IDDQ values is evaluated using data from the SEMATECH test methods experiment. The results from clustering are compared to the results obtained on actual silicon during the SEMATECH study. The differences between the results obtained in each case are analyzed. The clustering approach is also compared to two common IDDQ test techniques, the single-threshold approach and the delta-IDDQ approach, and the results are presented
  • Keywords
    CMOS integrated circuits; failure analysis; integrated circuit measurement; integrated circuit testing; statistical analysis; CMOS; IDDQ measurements; IC classification; IC testing; SEMATECH test methods experiment; clustering based evaluation; Application software; Failure analysis; Gas detectors; Instruments; Integrated circuit testing; Manufacturing; Packaging; Process design; Production; Read only memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2000. Proceedings. 18th IEEE
  • Conference_Location
    Montreal, Que.
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-0613-5
  • Type

    conf

  • DOI
    10.1109/VTEST.2000.843877
  • Filename
    843877
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2014945