Title :
Application Overview of the Potential Seebeck Microscope
Author :
Ziolkowski, P. ; Karpinski, G. ; Platzek, D. ; Stiewe, C. ; Müller, E.
Author_Institution :
German Aerosp. Center, Inst. of Mater. Res., Cologne
Abstract :
The scanning Potential Seebeck Microscope (PSM) turned out to be a suitable tool to investigate material properties not only for thermoelectrics. Numerous cooperation and projects which were successfully accomplished by DLR and Panco and their national and international partners have shown the wide spectrum of application for this measurement instrument. The continuing extension of applications and further developments on this instrument were documented within several publications [Platzek, et al., 2005, Platzek, et al., 2005, Chen, et al., 2005, Ziolkowski, et al., 2006, Platzek, et al., 2003] showing the scientific output achieved by applying the PSM. With regard to the further developments which have been made and the results obtained so far, this work will give an overview of the possible applications of the PSM. This multiplexed informations will mark the present status of development and will give an outlook for further goals to reach
Keywords :
Seebeck effect; electrical conductivity measurement; scanning probe microscopy; thermoelectric devices; material homogeneity; measurement instrument; phase purity; scanning potential Seebeck microscope; spatially resolved measurement; thermal conductivity; thermoelectric property; Aerospace materials; Conducting materials; Electric variables measurement; Instruments; Microscopy; Probes; Temperature measurement; Thermal conductivity; Thermoelectricity; Voltage;
Conference_Titel :
Thermoelectrics, 2006. ICT '06. 25th International Conference on
Conference_Location :
Vienna
Print_ISBN :
1-4244-0811-3
Electronic_ISBN :
1094-2734
DOI :
10.1109/ICT.2006.331234
