• DocumentCode
    2015654
  • Title

    Comparison of enhancement- and depletion-mode triple stacked power amplifiers in 0.5 µm AlGaAs/GaAs PHEMT technology

  • Author

    Shen, Chih-Chun ; Chang, Hong-Yeh ; Vendelin, George D.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
  • fYear
    2009
  • fDate
    28-29 Sept. 2009
  • Firstpage
    222
  • Lastpage
    225
  • Abstract
    This paper describes triple stacked power amplifiers using 0.5 mum enhancement- and depletion-mode (E/D-mode) AlGaAs/GaAs pseudomorphic high electron-mobility transistors (PHEMTs). Based on the optimum capacitance at the gate termination of common-gate (CG) transistor, the output 1-dB compression points (P1dB) of the E- and D-mode triple stacked power amplifiers are 22.1 and 19.3 dBm, respectively. The third-order output intercept point (OIP3) of the E- and D-mode stacked power amplifiers are higher than 32 and 25 dBm, respectively. The E-mode stacked power amplifier demonstrates better output power and linearity as compared with the D-mode stacked power amplifier due to the device characteristics. Moreover, the comparison between the E- and the D-mode tacked power amplifiers is also presented.
  • Keywords
    HEMT integrated circuits; III-V semiconductors; aluminium compounds; field effect MIMIC; gallium arsenide; millimetre wave power amplifiers; AlGaAs-GaAs; PHEMT technology; common-gate transistor; depletion-mode power amplifier; enhancement-mode power amplifier; pseudomorphic high electron-mobility transistor; size 0.5 mum; third-order output intercept point; triple stacked power amplifier; Capacitance; Character generation; Circuits; Gallium arsenide; Heterojunction bipolar transistors; High power amplifiers; Impedance; PHEMTs; Power amplifiers; Voltage; Power Amplifier (PA); Stacked PA; enhancement/depletion-pseudomorphic high-electron mobility transistor (E/D-PHEMT);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Integrated Circuits Conference, 2009. EuMIC 2009. European
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-4749-7
  • Type

    conf

  • Filename
    5296061