DocumentCode :
2016612
Title :
Lifetime evaluation on mid-infrared solid state laser
Author :
Lu Guo-guang ; Hao Ming-ming
Author_Institution :
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., Fifth Res. Inst., Guangzhou, China
fYear :
2015
fDate :
11-14 Aug. 2015
Firstpage :
19
Lastpage :
21
Abstract :
In this paper, 3-5μm solid state laser aging equipment was set up, according to the actual aging test result, we confirmed that the 3-5μm laser module (optical parametric oscillator) was the weakness part for the lifetime of the solid-state laser. Three groups of aging tests which the pumping power for the optical parametric oscillator was the accelerated stress were conducted on 3-5μm solid state lasers, according to the aging data analysis result, we can not only obtain the exponential degradation model of the optical parametric oscillator, but also we can obtain the accelerated model, and using these models we can quantitive evaluate the lifetime of the mid-infrared solid-state laser.
Keywords :
ageing; life testing; solid lasers; accelerated stress; aging equipment; aging test; exponential degradation model; laser module; lifetime evaluation; mid-infrared solid state laser; optical parametric oscillator; pumping power; wavelength 3 mum to 5 mum; Solids; aging test; degradation; lifetime; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
Conference_Location :
Changsha
Type :
conf
DOI :
10.1109/ICEPT.2015.7236535
Filename :
7236535
Link To Document :
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