Reliability- and Process-Variation Aware Design of VLSI Circuits

Author

Alam, M. ; Kang, Kary ; Paul, Bipul ; Roy, Kaushik

Author_Institution

Purdue Univ., West Lafayette

fYear

2007

fDate

11-13 July 2007

Abstract

We review the literature for reliability- and process-variation aware VLSI design to find that an exciting area of research/application is rapidly emerging as a core topic of IC design. Design of reliable circuits with unreliable component is a significant challenge that is likely to remain relevant for all circuit designs from now on, therefore any contribution in this field is likely to have lasting effect of the design philosophy of integrated circuits

Keywords

VLSI; integrated circuit design; integrated circuit reliability; IC design; VLSI circuits; cicuit reliability; process variation aware design; Application specific integrated circuits; Circuit synthesis; Circuit testing; Delay; Design methodology; Design optimization; Integrated circuit reliability; Process design; Transistors; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Physical and Failure Analysis of Integrated Circuits, 2007. IPFA 2007. 14th International Symposium on the

Conference_Location

Bangalore

Print_ISBN

978-1-4244-1014-9

Type

conf

DOI

10.1109/IPFA.2007.4378050

Filename

4378050

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2016791