Title : 
High-power digital controlled artificial dielectric GaN reconfigurable transmission lines for digitally assisted RFICs
         
        
            Author : 
Watanabe, Monte ; LaRocca, Tim
         
        
            Author_Institution : 
Northrop Grumman Aerosp. Syst., Redondo Beach, CA, USA
         
        
        
        
        
        
            Abstract : 
The first known GaN implementation of high-power digital controlled artificial dielectric (DiCAD) reconfigurable transmission lines is presented. DiCAD was formed by integrating GaN HEMT switches and metal-insulator-metal capacitors (MIMCAPs) into coplanar strip transmission lines. Standard GaN HEMT processing techniques were used, making DiCAD easily compatible with future circuit designs. The DiCAD transmission line´s effective dielectric constant exhibits linear digital control from 15 to 32 with 3-bit resolution up to 50GHz. P1dB is measured to be greater than 27dBm and OIP3 is calculated to be greater than 48dBm for all states.
         
        
            Keywords : 
III-V semiconductors; MIS capacitors; coplanar transmission lines; dielectric devices; digital control; field effect transistor switches; gallium compounds; millimetre wave integrated circuits; strip lines; wide band gap semiconductors; DiCAD reconfigurable transmission lines; GaN; HEMT switches; MIMCAP; RFIC; circuit designs; coplanar strip transmission lines; dielectric constant; digital controlled artificial dielectric reconfigurable transmission lines; frequency 50 GHz; linear digital control; metal-insulator-metal capacitors; word length 3 bit; CMOS integrated circuits; Dielectric constant; Gallium nitride; Microwave amplifiers; Power transmission lines; Transmission line measurements; Coplanar transmission lines; digital control; gallium nitride; permittivity; slow wave structures;
         
        
        
        
            Conference_Titel : 
Radio Frequency Integrated Circuits Symposium (RFIC), 2011 IEEE
         
        
            Conference_Location : 
Baltimore, MD
         
        
        
            Print_ISBN : 
978-1-4244-8293-1
         
        
            Electronic_ISBN : 
1529-2517
         
        
        
            DOI : 
10.1109/RFIC.2011.5940625